Publicações

2020

  • D. Oliveira, F. F. Dos Santos., G. P. Davila, C. Cazzaniga, C. Frost, R. C. Baumann, P. Rech. High-Energy Versus Thermal Neutron Contribution to Processor and Memory Error Rates. IEEE Transactions on Nuclear Science, v. 67, p. 1161-1168, 2020.
  • D. Oliveira, S. Blanchard, N. DeBardeleben, F. F. Dos Santos, G. Davila, P. Navaux, A. Favalli, O. Schappert, S. Wender, C. Cazzaniga , C. Frost, P. Rech. Thermal neutrons: a possible threat for supercomputer reliability. The Journal of Supercomputing (Dordrecht. Online), v. 1, p. 1, 2020.
  • D. Oliveira, S. Blanchard, N. DeBardeleben, F. F. Dos Santos, G. Davila, P. Navaux, S. WENDER, C. Cazzaniga, C. Frost, R. C. Baumann, P. Rech . An Overview of the Risk Posed by Thermal Neutrons to the Reliability of Computing Devices. In: 2020 50th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Supplemental Volume (DSNS), 2020, Valencia. 2020 50th Annual IEEE-IFIP International Conference on Dependable Systems and Networks-Supplemental Volume (DSN-S), p. 92., 2020.
  • D. Oliveira, S. Blanchard, N. DeBardeleben, F. F. Dos Santos, G. Davila, P. Navaux, C. Cazzaniga, C. Frost, R. C. Baumann, P. Rech . Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications. In: 2020 IEEE European Test Symposium (ETS), 2020, Tallinn. 2020 IEEE European Test Symposium (ETS), p. 1, 2020.

2019

  • D. Oliveira, P. Navaux, P. Rech . Increasing the Efficiency and Efficacy of Selective-Hardening for Parallel Applications. In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2019, Noordwijk. 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2019.
  • F. Fernandes, C. Lunardi, D. Oliveira, F. Libano, and P. Rech, "Reliability evaluation of mixed-precision architectures," in to appear in 2019 IEEE International Symposium on High Performance Computer Architecture (HPCA), Feb 2019.
  • G. P. Davila, D. Oliveira, P. Navaux, and P. Rech, "Identifying the most reliable collaborative workload distribution in heterogeneous device," in to appear in 2019 Design, Automation Test in Europe Conference Exhibition (DATE), Florence, Italy, March 2019.
  • G. P. Davila, D. Oliveira, and P. Rech, "Impact of workload distribution on energy consumption, performance, and reliability of heterogeneous devices," in to appear in 2019 27th Euromicro International Conference on Parallel, Distributed and Network-based Processing (PDP), Feb 2019.
  • F. Birck, D. Oliveira, and P. Navaux, "Spada: A statistical program attack detection analysis," in To appear in Proceedings of the Computing Frontiers Conference, ser. CF’19. ACM, 2019.

2018

  • V. Fratin, D. Oliveira, P. Navaux, L. Carro, and P. Rech, "Energy-delay-fit product to compare processors and algorithm implementations," Microelectronics Reliability, vol. 84, pp. 112–120, May 2018.
  • D. Oliveira, F. B. Moreira, P. Rech, and P. Navaux, "Predicting the reliability behavior of hpc applications," in 2018 30th International Symposium on Computer Architecture and High Performance Computing (SBAC-PAD). IEEE, 2018, pp. 124–131.
  • V. Fratin, D. Oliveira, C. Lunardi, F. Santos, G. Rodrigues, and P. Rech, "Code-dependent and architecture-dependent reliability behaviors," in 2018 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), June 2018, pp. 13–26.

2017

  • C. Lunardi, H. Quinn, L. Monroe, D. Oliveira, P. Navaux, and P. Rech, "Experimental and analytical analysis of sorting algorithms error criticality for hpc and large servers applications," IEEE Transactions on Nuclear Science, vol. 64, no. 8, pp. 2169–2178, Aug 2017.
  • D. A. G. D. Oliveira, L. L. Pilla, M. Hanzich, V. Fratin, F. Fernandes, C. Lunardi, J. M. Cela, P. O. A. Navaux, L. Carro, and P. Rech, "Radiation-induced error criticality in modern hpc parallel accelerators," in 2017 IEEE International Symposium on High Performance Computer Architecture (HPCA), Feb 2017, pp. 577–588.
  • D. Oliveira, L. Pilla, N. DeBardeleben, S. Blanchard, H. Quinn, I. Koren, P. Navaux, and P. Rech, "Experimental and analytical study of xeon phi reliability," in Proceedings of the International Conference for High Performance Computing, Networking, Storage and Analysis, ser. SC ’17. New York, NY, USA: ACM, 2017, pp. 28:1–28:12.
  • D. Oliveira, V. Frattin, P. Navaux, I. Koren, and P. Rech, "Carol-fi: An efficient fault-injection tool for vulnerability evaluation of modern hpc parallel accelerators," in Proceedings of the Computing Frontiers Conference, ser. CF’17. New York, NY, USA: ACM, 2017, pp. 295–298.

2016

  • D. A. G. de Oliveira, L. L. Pilla, T. Santini, and P. Rech, "Evaluation and mitigation of radiation-induced soft errors in graphics processing units," IEEE Transactions on Computers, vol. 65, no. 3, pp. 791–804, March 2016.
  • D. Oliveira, L. Pilla, F. Fernandes, C. Lunardi, I. Koren, P. Navaux, L. Carro, and P. Rech, "Input size effects on the radiation-sensitivity of modern parallel processors," in 2016 IEEE Radiation Effects Data Workshop (REDW). Portland, OR, USA: IEEE, July 2016, pp. 1–6.

2015

  • L. L. Pilla, D. A. G. Oliveira, C. Lunardi, P. O. A. Navaux, L. Carro, and P. Rech, "Memory access time and input size effects on parallel processors reliability," IEEE Transactions on Nuclear Science, vol. 62, no. 6, pp. 2627–2634, Dec 2015.
  • D. Tiwari, S. Gupta, J. Rogers, D. Maxwell, P. Rech, S. Vazhkudai, D. Oliveira, D. Londo, N. Debardeleben, P. Navaux, L. Carro, and B. Buddy, "Understanding GPU Errors on Largescale HPC Systems and the Implications for System Design and Operation," in 21st IEEE Symp. on High Performance Computer Architecture. Burlingame, CA, USA: IEEE, February 2015, pp. 331–342.
  • D. A. G. Oliveira, L. Pilla, C. Lunardi, L. Carro, P. O. A. Navaux, and P. Rech, "The path to exascale: Code optimizations and hardening solutions reliability," in Proceedings of the 5th Workshop on Fault Tolerance for HPC at eXtreme Scale, ser. FTXS 15. New York, NY, USA: ACM, 2015, pp. 55–62.

2014

  • D. A. G. Oliveira, P. Rech, H. M. Quinn, T. D. Fairbanks, L. Monroe, S. E. Michalak, C. Anderson-Cook, P. O. A. Navaux, and L. Carro, "Modern gpus radiation sensitivity evaluation and mitigation through duplication with comparison," IEEE Transactions on Nuclear Science, vol. 61, no. 6, pp. 3115–3122, Dec 2014.
  • D. A. G. Oliveira, P. Rech, L. L. Pilla, P. O. A. Navaux, and L. Carro, "Gpgpus ecc efficiency and efficacy," in 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). Amsterdam, Netherlands: IEEE, Oct 2014, pp. 209–215.
  • D. A. G. Oliveira, C. Lunardi, L. L. Pilla, P. Rech, P. O. A. Navaux, and L. Carro, "Radiation Sensitivity of High Performance Computing Applications on Kepler-Based GPGPUs," in International Workshop on Fault Tolerance for HPC at eXtreme Scale (FTXS 2014), colocated with IEEE International Conference on Dependable Systems and Networks (DSN 2014). Atlanta, USA: IEEE, 2014, pp. 732–737.